Amazon cover image

Image from Amazon.com

Image from Google Jackets

Image from Coce

Normal view MARC view ISBD view

SEMICONDUCTOR MEMORIES: TECHNOLOGY, TESTING, RELIABILITY

By:

ASHOK K, SHARMA

Material type: Text

Text

TextPublication details: 2004ISBN:

8120316835

DDC classification:

621.381

Tags from this library: No tags from this library for this title.

Average rating: 0.0 (0 votes)

Holdings ( 5 )

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Reference	Central Library, SRM Institute of Science and Technology Reference Rack - 06 - C		Not for loan		1207
Books	Central Library, SRM Institute of Science and Technology Rack - 30 - J		Available		1208
Books	Central Library, SRM Institute of Science and Technology Rack - 30 - J		Available		1209
Books	Central Library, SRM Institute of Science and Technology Rack - 30 - J		Available		1210
Books	Central Library, SRM Institute of Science and Technology Rack - 30 - J		Available		1211

Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Central Library, SRM Institute of Science and Technology, Delhi-NCR Campus, Delhi-Meerut Road, Modi Nagar, Ghaziabad, Uttar Pradesh-201204 (India)